KLA, AFS-3220, Flatness Measuring
| ID | 199220216 |
|---|---|
| Description | Wafer 300mm, Scan Thickness: accuracy 0.25um |
| Manufacturer | KLA |
| Model | AFS-3220 |
| Vintage | 2003.01.31 |
| Serial No. | N/A |
| Quantity | 1 |
| Condition | As-is |
| Equipment Detail |
Flatness Measuring |
Product Details
Main text
- ID: 199220216
- EQUIPMENT: Flatness Measuring
- DESCRIPTION: Wafer 300mm, Scan Thickness: accuracy 0.25um
- MODEL: AFS-3220
- MAKER: KLA
- VINTAGE: 2003.01.31
- CONDITION: As-is
- QUANTITY: 1
Attachments
- Catalog-KLAADE- AFS 3220 Flatness Measuring.pdf (3.4M) 12downloads | DATE : 2023-09-15 10:30:18
- Prev Plasma Therm, VERSALINE, ICP-RIE Etcher 25.01.21
- Next KLA, AFS-3220, Flatness Measuring 23.09.15
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