KLA, AFS-3220, Flatness Measuring
| ID | 199220212 |
|---|---|
| Description | Wafer 300mm, Scan Thickness: accuracy 0.25um |
| Manufacturer | KLA |
| Model | AFS-3220 |
| Vintage | 2021 |
| Serial No. | AMS101 |
| Quantity | 1 |
| Condition | As-is |
| Equipment Detail |
Flatness Measuring |
Product Details
Main text
- ID: 199220212
- EQUIPMENT: Flatness Measuring
- DESCRIPTION: Wafer 300mm, Scan Thickness: accuracy 0.25um
- MODEL: AFS-3220
- MAKER: KLA
- VINTAGE: 2021
- CONDITION: As-is
- QUANTITY: 1
Attachments
- Catalog-KLAADE- AFS 3220 Flatness Measuring.pdf (3.4M) 16downloads | DATE : 2023-09-15 10:30:18
- Prev KLA, AFS-3220, Flatness Measuring 23.09.15
- Next Hitachi, S-3000H, SEM (Scanning Electron Microscope) 24.12.12
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