Park Systems, XE-150, AFM (Atomic Force Microscope)
| ID | 199180025 |
|---|---|
| Description | XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) |
| Manufacturer | Park Systems |
| Model | XE-150 |
| Vintage | 2010 |
| Serial No. | N/A |
| Quantity | 1 |
| Condition | Working |
| Equipment Detail |
AFM (Atomic Force Microscope) |
Product Details
Main text
- ID: 199180025
- EQUIPMENT: AFM (Atomic Force Microscope)
- DESCRIPTION: XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max)
- MAKER: Park Systems
- MODEL: XE-150
- VINTAGE: 2010
- CONDITION: Working
- QUANTITY: 1
- Prev Nanoscope, NS-3000, 3D Confocal Microscope 22.05.02
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