SII NANOTECHNOLOGY, SFT-110, XRF Coating Thickness Analyzer
| ID | 199220080 |
|---|---|
| Description | N/A |
| Manufacturer | SII NANOTECHNOLOGY |
| Model | SFT-110 |
| Vintage | Unknown |
| Serial No. | 10400731000022 |
| Quantity | 1 |
| Condition | As-is |
| Equipment Detail |
XRF Coating Thickness Analyzer |
产品详细
Main text
- ID: 199220080
- EQUIPMENT: XRF Coating Thickness Analyzer
- DESCRIPTION: N/A
- MAKER: SII NANOTECHNOLOGY
- MODEL: SFT-110
- VINTAGE: Unknown
- CONDITION: As-is
- QUANTITY: 1
- 上一页 Helmut Fischer, XULM-XYM, X-ray Thickness Tester 22.10.28
- 下一页 OLYMPUS, BX3M-LEDR, Optical Microscope 24.09.06

