| ID | 199180025 |
|---|---|
| Description | XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) |
| Manufacturer | Park Systems |
| Model | XE-150 |
| Vintage | 2010 |
| Serial No. | N/A |
| Quantity | 1 |
| Condition | Working |
| Equipment Detail |
AFM (Atomic Force Microscope) |
| ID | 199180025 |
|---|---|
| Description | XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) |
| Manufacturer | Park Systems |
| Model | XE-150 |
| Vintage | 2010 |
| Serial No. | N/A |
| Quantity | 1 |
| Condition | Working |
| Equipment Detail |
AFM (Atomic Force Microscope) |
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